Mipox will provide “polishing and measurement service” for CMP application.
Posted on: 11 11, 2015
Mipox expands the service of OEM polishing and OEM measurement for CMP application, based on the inquiries from many customers. In addition to CMP polishing by our polishing goods (slurry), customers can measure and observe the polishing object with following 3 tools.
・Non contact layer thickness measurement machine (measurement of transparent layer)
・Resistivity meter (measurement of thin metal layer)
・Metal microscope (Differential interference observation)
We also welcome the inquiries on object measurement.